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  • Scanning Electron Microscopy Basics presented by Chris Butcher.
  • From Sample Preparation to Multiscale and Multimodal Correlative Microscopy Imaging Speaker: Prof Toni Tang, McMaster ...
  • Presenter: Carmen Andrei.
  • Follow Brian Langelier through the APT process with Part two of his
  • An introduction to the Focused Ion Beam presented by Travis Casagrande.

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Presenter: Hui Yuan, Presenter: Chris Butcher. Jhoynner Martinez discuss tips and tricks for preparing metals for Presenter: Joe Deering,

Follow along with Natalie Hamada to learn about Scanning Transmission Electron Microscopy.

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